This paper deals with correcting matrix effects and interferences between spectral lines and background in X-ray fluorescence analyses of trace elements (especially trace REE) in rocks. It can also be used for Ti, V, Cr,Mn, Co, Ni, Cu, Zn, Nb, Zr, Hf, Rb, Sr,, U, Th, Pb, W and Ba. The detection limits are 5-X × lOppm.
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王毅民,梁国立,1984,岩石中低量稀土和其他痕量元素的X-荧光光谱测定[J].岩石矿物学杂志,3(1):58~63.,1984,Determination of Trace Rare Earth Elements and Other Trace Elements in Rocks by X-Ray Fluorescence Analyses[J]. Acta Petrologica et Mineralogica,3(1):58~63.